Development of the methodology for preparation of ultrafine and fine grain materials based on Al and AlTi for microstructural characterization via EBSD method


Project start:01.01.2016
Project end:31.12.2018
Programme:VEGA
Project number:2/0158/16
Institute position in the project:The only one project investigator
Project leader:Martin Nosko
The role of EBSD (Electron BackScatter Diffraction) in microstructural characterization of materials continuously increases. However, besides the correctly adjusted system, the preparation of the analysed samples that differs from material to material plays a key role in this analysis. Previous studies were directed towards large grain materials based on Fe, Ti, NI Al etc. where the analysis provides satisfactory results. Completely different situation is in materials exhibiting large quantities of grain boundaries i.e. locations where the regularity of crystal lattices is interrupted. Here the actual limits of the EBSD methods are not set yet. The project is focused to study the key methods and parameters of sample preparation that are decisive in EBSD analysis of ultrafine and fine grained materials. The results will be tested on Al and AlTi based materials.